Strona 2 z 2

: 28 września 2013, 14:12
autor: chp
MEMTEST86 nie wykazał błędów pamięci. MHDD nie pokazał uszkodzonych sektorów dysku. Smart odczytywany z tego dysku w momencie, kiedy był podpięty jako zewnętrzny przez port USB do innego komputera pokazał jakieś błędy, natomiast po włożeniu dysku do badanego Asusa już nie. Poniżej wyniki:

Kod: Zaznacz cały

smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-53-generic-pae] (local build)
Copyright (C) 2002-11 by Bruce Allen, [URL]http://smartmontools.sourceforge.net[/URL]

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint M7E (AFT)
Device Model:     SAMSUNG HM321HI
Serial Number:    S24PJ9AB901050
LU WWN Device Id: 5 0024e9 206037442
Firmware Version: 2AJ10001
User Capacity:    320,072,933,376 bytes [320 GB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Fri Sep 27 18:58:10 2013 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)    Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)    The previous self-test routine completed
                    without error or no self-test has ever 
                    been run.
Total time to complete Offline 
data collection:         ( 4980) seconds.
Offline data collection
capabilities:              (0x5b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:      (   2) minutes.
Extended self-test routine
recommended polling time:      (  83) minutes.
SCT capabilities:            (0x003f)    SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   100   100   051    Pre-fail  Always       -       9
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   089   089   025    Pre-fail  Always       -       3516
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       838
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       1032
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   099   099   000    Old_age   Always       -       1273
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       851
191 G-Sense_Error_Rate      0x0022   100   100   000    Old_age   Always       -       617
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   064   036   000    Old_age   Always       -       31 (Min/Max 16/65)
195 Hardware_ECC_Recovered  0x003a   100   100   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   252   252   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   084   084   000    Old_age   Always       -       8585
200 Multi_Zone_Error_Rate   0x002a   100   100   000    Old_age   Always       -       14365
223 Load_Retry_Count        0x0032   099   099   000    Old_age   Always       -       1273
225 Load_Cycle_Count        0x0032   098   098   000    Old_age   Always       -       24189

SMART Error Log Version: 1
ATA Error Count: 5234 (device log contains only the most recent five errors)
    CR = Command Register [HEX]
    FR = Features Register [HEX]
    SC = Sector Count Register [HEX]
    SN = Sector Number Register [HEX]
    CL = Cylinder Low Register [HEX]
    CH = Cylinder High Register [HEX]
    DH = Device/Head Register [HEX]
    DC = Device Command Register [HEX]
    ER = Error register [HEX]
    ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 5234 occurred at disk power-on lifetime: 1032 hours (43 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 00 00 00 00 00

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 01 00 00 00 00 0a      00:00:05.363  IDENTIFY DEVICE
  ec 00 01 00 00 00 00 0a      00:00:05.363  IDENTIFY DEVICE
  c8 00 10 d8 30 0a e0 0a      00:00:05.363  READ DMA
  c8 00 08 e0 2c 01 e0 0a      00:00:05.363  READ DMA
  c8 00 08 a8 2b 01 e0 0a      00:00:05.363  READ DMA

Error 5233 occurred at disk power-on lifetime: 1032 hours (43 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 00 00 00 00 a0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 01 01 00 00 a0 00      00:00:05.351  IDENTIFY DEVICE
  00 00 01 01 00 00 40 00      00:00:05.350  NOP [Abort queued commands]
  00 00 01 01 00 00 40 00      00:00:05.340  NOP [Abort queued commands]
  00 00 01 01 00 00 40 00      00:00:05.338  NOP [Abort queued commands]
  ea 00 00 ff 1a 01 e0 0a      00:00:05.338  FLUSH CACHE EXT

Error 5232 occurred at disk power-on lifetime: 1032 hours (43 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 00 00 00 00 00

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 01 00 00 00 00 0a      00:00:04.131  IDENTIFY DEVICE
  c8 00 08 00 f0 a9 e1 0a      00:00:04.131  READ DMA
  c8 00 08 f8 0f 2a e1 0a      00:00:04.131  READ DMA
  c8 00 08 00 00 00 e0 0a      00:00:04.131  READ DMA
  27 00 00 00 00 00 e0 0a      00:00:04.131  READ NATIVE MAX ADDRESS EXT

Error 5231 occurred at disk power-on lifetime: 1031 hours (42 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 00 00 00 00 a0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 00 00 00 00 a0 0a      00:00:02.706  IDENTIFY DEVICE
  ec 00 00 00 00 00 a0 0a      00:00:02.706  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 0a      00:00:02.706  SET FEATURES [Set transfer mode]
  27 00 00 00 00 00 e0 0a      00:00:02.706  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 0a      00:00:02.706  IDENTIFY DEVICE

Error 5230 occurred at disk power-on lifetime: 1031 hours (42 days + 23 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 00 00 00 00 a0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 00 00 00 00 a0 0a      00:00:02.700  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 0a      00:00:02.700  SET FEATURES [Set transfer mode]
  27 00 00 00 00 00 e0 0a      00:00:02.700  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 0a      00:00:02.700  IDENTIFY DEVICE
  00 00 01 01 00 00 00 0a      00:00:02.700  NOP [Abort queued commands]

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%      1032         -
# 2  Short offline       Interrupted (host reset)      90%       995         -

Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed [00% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.