Mam zamiar kupić używany dysk Seagate Barracuda ST360014A i przed zakupem chciałbym wiedzieć jaka jest kondycja tego dysku.
Na dysku nie ma obecnie żadnego systemu i w związku z tym znalazłem program, którym można odczytać SMART.
Załączam zrzuty oraz raport z programu i proszę o napisanie opinii o tym dysku:
Kod: Zaznacz cały
smartctl 5.39 2009-12-09 r2995 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus family
Device Model: ST360014A
Serial Number: 3JV1629K
Firmware Version: 3.04
User Capacity: 60,022,480,896 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2
Local Time is: Sat Apr 17 12:17:16 2010 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 58) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 059 051 006 Pre-fail Always - 101254673
3 Spin_Up_Time 0x0003 098 098 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 097 097 020 Old_age Always - 4000
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 6
7 Seek_Error_Rate 0x000f 085 060 030 Pre-fail Always - 390659479
9 Power_On_Hours 0x0032 090 090 000 Old_age Always - 9253
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 094 094 020 Old_age Always - 6319
194 Temperature_Celsius 0x0022 041 054 000 Old_age Always - 41
195 Hardware_ECC_Recovered 0x001a 059 051 000 Old_age Always - 101254673
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 187 000 Old_age Always - 13
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 448 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 448 occurred at disk power-on lifetime: 9249 hours (385 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 00 00 00 f0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 00 00 00 f0 00 00:05:27.332 READ DMA
c8 00 01 00 00 00 f0 00 00:05:27.321 READ DMA
c8 00 01 00 00 00 f0 00 00:05:26.721 READ DMA
c8 00 01 6e 28 65 f4 00 00:05:26.705 READ DMA
c8 00 01 f8 11 f4 f1 00 00:05:26.705 READ DMA
Error 447 occurred at disk power-on lifetime: 9249 hours (385 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 f8 11 f4 f1 Error: ICRC, ABRT 1 sectors at LBA = 0x01f411f8 = 32772600
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 f8 11 f4 f1 00 00:04:18.426 READ DMA
c8 00 01 f8 11 f4 f1 00 00:04:18.412 READ DMA
c8 00 01 00 00 00 f0 00 00:04:17.705 READ DMA
c8 00 01 00 00 00 f0 00 00:04:17.694 READ DMA
c8 00 01 00 00 00 f0 00 00:04:16.044 READ DMA
Error 446 occurred at disk power-on lifetime: 9249 hours (385 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 f8 11 f4 f1 Error: ICRC, ABRT 1 sectors at LBA = 0x01f411f8 = 32772600
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 f8 11 f4 f1 00 00:04:18.426 READ DMA
c8 00 01 00 00 00 f0 00 00:04:18.412 READ DMA
c8 00 01 00 00 00 f0 00 00:04:17.705 READ DMA
c8 00 01 00 00 00 f0 00 00:04:17.694 READ DMA
c8 00 01 6e 28 65 f4 00 00:04:16.044 READ DMA
Error 445 occurred at disk power-on lifetime: 9249 hours (385 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 f8 11 f4 f1 Error: ICRC, ABRT 1 sectors at LBA = 0x01f411f8 = 32772600
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 f8 11 f4 f1 00 00:04:14.713 READ DMA
c8 00 01 00 00 00 f0 00 00:04:14.713 READ DMA
c8 00 01 00 00 00 f0 00 00:04:14.698 READ DMA
c8 00 01 00 00 00 f0 00 00:04:13.992 READ DMA
c8 00 01 6e 28 65 f4 00 00:04:16.044 READ DMA
Error 444 occurred at disk power-on lifetime: 9249 hours (385 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 00 00 00 f0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 00 00 00 f0 00 00:04:10.197 READ DMA
c8 00 01 00 00 00 f0 00 00:04:10.196 READ DMA
c8 00 01 6e 28 65 f4 00 00:04:10.195 READ DMA
c8 00 01 f8 11 f4 f1 00 00:04:10.177 READ DMA
c8 00 01 00 00 00 f0 00 00:04:09.143 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 9253 -
# 2 Short offline Completed without error 00% 9253 -
# 3 Short offline Completed without error 00% 9252 -
# 4 Short offline Completed without error 00% 2290 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.